立崎 武弘

Tachizaki Takehiro

  • 講師
  • 学位:博士(工学)

基本情報

所属

  • Undergraduate School of Engineering / Department of Optical and Imaging Science and Technology

詳細情報

研究キーワード

  • optical microscopy
  • Measurement system
  • optical physics
  • thin films
  • terahertz
  • surfaces and interfaces
  • quantum well
  • optica interferometer
  • phase change material
  • time-resolved spectroscopy
  • intense terahertz
  • coherent phonon
  • ultrasonics
  • magnetic force microscopy
  • atomic force microscopy
  • Scanning near-field optical microscopy
  • near-field optics
  • Scanning probe microscopy
  • Optica metlorogy

研究分野

  • Nanotechnology/Materials Optical engineering and photonics Optical Properties of Condensed Matters
  • Nanotechnology/Materials Optical engineering and photonics Optical Metrology
  • Nanotechnology/Materials Thin-film surfaces and interfaces Thin film, Surfaces and Interfaces
  • Nanotechnology/Materials Thin-film surfaces and interfaces Scanning Probe Microscopy

受賞

  • R&D Magazine 2014 R&D100 Plasmon-Excitation Optical Scanning Probe Microscope (Optical SPM)
  • R&D Magazine 2011 R&D100 Picometer-Resolution Quantitative Metrology Atomic Force Microscope
  • Symposium on Ultrasonic Electronics Young Scientist Award
  • Course of Sustainable Resources Engineering, Hokkaido University Teacher of the year 2003

論文

Terahertz pulse-altered gene networks in human induced pluripotent stem cells.

Nanometer-precise optical length measurement using near-field scanning optical microscopy with sharpened single carbon nanotube probe

Generation of broadband near-field optical spots using a thin-film silicon waveguide with gradually changing thickness

Acoustic whispering-gallery modes generated and dynamically imaged with ultrashort optical pulses

Scanning ultrafast Sagnac interferometry for imaging two-dimensional surface wave propagation

産業財産権

  • Defect detection method and defect detection device and defect observation device provided with same
  • Defect detection method and defect detection device and defect observation device provided with same
  • Scanning Probe Miscroscope
  • Scanning probe microscope and measurement method using same
  • Distance measuring device and distance measuring method
  • Defect detection method and defect detection device and defect observation device provided with same
  • Thermally assisted magnetic recording head inspection method and apparatus
  • Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus
  • Scanning probe microscope and surface shape measurement method using same
  • Thermally assisted magnetic recording head inspection method and apparatus

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